Article Information

Title: Comparison of GaAs FET Models for Simulating the I-V Characteristics Sub micron GaAs FET

Authors: N. M. MEMON, A.A. MEMON, A. A. MEMON

Journal: Sindh University Research Journal - Science Series (SURJ)

HEC Recognition History
Category From To
Y 2024-10-01 2025-12-31
Y 2023-07-01 2024-09-30
Y 2021-07-01 2022-06-30

Publisher: University of Sindh, Jamshoro

Country: Pakistan

Year: 2013

Volume: 45

Issue: 2

Language: English

Keywords: GaAsMESFETDC ModelsRMS Error

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